TECHNOLOGIST - PIE Yield Enhancement

• Perform cross‑section analysis and Scanning Electron Microscopy (SEM) inspection to monitor process health and ensure production quality.
• Handle Transmission Electron Microscopy (TEM) sample preparation using Focus Ion Beam (FIB) for detailed TEM inspection.
• Identify defects and failure mechanisms through physical failure analysis using a variety of sample de‑processing techniques and a wide range of failure analysis equipment.
• Complete physical fault isolation techniques to pinpoint and resolve issues that may impact production efficiency.
• Collaborate with engineering teams to provide timely feedback and implement solutions to maintain efficient production tool performance.
• Support analysis of wafers with functional failures by applying various Failure Analysis tools and techniques to isolate defects and identify root causes.
• Preserve comprehensive documentation of analytical findings and approaches ...

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Submit your application today and join our talented team at 1100 Micron SemiAsiaOP Pte Ltd.