PhD in Adapting Transformer Models for Defect Detection with Limited Data

Introduction

Join the NWO Perspectief FIND program and develop methods to adapt Transformer-based foundation models for defect detection where data is scarce and unlabeled. Explore few-shot learning, self-supervised adaptation, and synthetic data generation to enable robust, scalable AI in semiconductor and printing systems. Work with leading industry partners like Canon and help transform quality inspection in next-generation high-tech equipment!

Job Description

Industrial edge deploymentsin semiconductor manufacturing, industrial printing systems, automotive radar, smart mobility cameras, and HealthTechrequire on-device AI to ensure low latency, privacy, and resilience. Todays Transformers models scale poorly and assume abundant cloud resources. The research program FIND aims to deliver architectural and algorithmic breakthroughs that enable foundation models to run predictably and efficiently on embedded processors and accel...

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