Metrology Engineer – Electron Microscopy & Advanced Characterization

Confidential
📍 Redmond, Washington, United States 💼 Full-time 🕒 Posted June 12, 2026

Job Description

Job Description
About the Role
We are seeking a Metrology Engineer with deep domain expertise in electron microscopy to join the
Waveguide Metrology Engineering team. In this role, you will own end-to-end FIB/SEM workflows—from
sample preparation through advanced imaging and analysis—supporting the characterization of optical
and semiconductor materials critical to next-generation AR/VR hardware. You will drive automation,
develop scalable metrology solutions, and collaborate cross-functionally to enable process development,
yield improvement, and technology roadmap execution.

Requirements

Responsibilities
● Own and develop end-to-end sample preparation and imaging workflows using Focused Ion
tBeam (FIB) and Scanning Electron Microscopy (SEM) techniques.
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Job Details

  • Location Redmond, Washington
  • Job Type Full-time
  • Category Physical Scientists
  • Posted Date June 12, 2026
  • Application Deadline July 22, 2026