Metrology Engineer – Electron Microscopy & Advanced Characterization

About the Role We are seeking a Metrology Engineer with deep domain expertise in electron microscopy to join the Waveguide Metrology Engineering team. In this role, you will own end-to-end FIB/SEM workflowsfrom sample preparation through advanced imaging and analysissupporting the characterization of optical and semiconductor materials critical to next-generation AR/VR hardware. You will drive automation, develop scalable metrology solutions, and collaborate cross-functionally to enable process development, yield improvement, and technology roadmap execution. Requirements Responsibilities Own and develop end-to-end sample preparation and imaging workflows using Focused Ion tBeam (FIB) and Scanning Electron Microscopy (SEM) techniques. Perform advanced characterization including Scanning Transmission Electron Microscopy (STEM) and Energy Dispersive X-ray Spectroscopy (EDX/EDS) on complex optical and semiconductor material systems. Drive automation of electron microscopy workflows to ...

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